Electrical characterization of zig-zag Aluminum thin films using experimental and theoretical methods

Journal of Optoelectronical Nanostructures

دوره 6، شماره 3 - شماره پیاپی 23، آبان 2021، صفحه 25-42   

نوع مقاله: Articles

شناسه دیجیتال (DOI): 10.30495/jopn.2021.27468.1218

نویسندگان

Mahsa Fakharpour^{* 1}؛ Maryam Gholizadeh Arashti²؛ Mohammad Taghi Musazade Meybodi³

¹Department of Physics, Maybod Branch, Islamic Azad University, Maybod, Iran

²Department of Physics, Yadegar-e-Imam Khomeini (RAH) Shahre Rey Branch, Islamic Azad University, Tehran, Iran

³Department of Electrical Engineering, Science and Art University, Yazd, Iran

تاریخ دریافت: 08 اسفند 1399،  تاریخ بازنگری: 17 آذر 1400،  تاریخ پذیرش: 03 آذر 1400 

چکیده

Zig-zag Al nanostructures were fabricated on the glass and steel using thermal evaporation technique. The structural, morphology and electrical properties of Al thin films were studied by using AFM, FESEM and four-point probe instrument. FESEM analysis showed that the grains are distributed on the zig-zag Al-glass and their shape is polygonal while the grains on the zig-zag Al-steel surface have a non-uniform distribution and the shape of the grains is oval. AFM analysis indicated the surface roughness of zig-zag Al-steel nanostructures is more than the zig-zag Al-glass. Moreover, the wrinkles on the zig-zag Al-steel and the small protuberances on the zig-zag Al-glass observed. The anisotropy of electrical was performed in two perpendicular directions x and y of the samples surface. The average electrical resistivity of the zig-zag Al films on glass and steel produced were obtained about 4.69×10-8 and 5.85×10-8 Ω.m, respectively. Simulation results by the perturbation method agree with the experimental results.

کلیدواژه‌ها

Anisotropy؛ Electrical characterization؛ Perturbation theory؛ Zig-zag Aluminum thin films؛ Perturbation Method

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